Optical Metrology

Optical metrology is the dimensional measurement of samples.

Optical Metrology – Related Articles

"...outstanding expertise in sample preparation and quality imaging along with fast turnaround has helped us to speed up our development efforts."

The JH team is always available for quality support when needed. It has been a very positive and refreshing experience."

JH Analytical provides insight into using vacuum coating in sample preparation and EDS analysis. Read our latest article to find out why!

JH Analytical celebrates the art of Metallography and the coexistence of science and art.

This case study explains measuring membrane deflection for biological sensors in a non-destructive way using an optical profiler vs. SEM.

Sputter coating grounds your specimen by covering it with a thin, conductive material layer—typically metal—to improve imaging significantly.