We have access to 2D and 3D x-ray systems through our local partner. We typically use these systems to help us locate the proper position to cut or section a sample.
JH Analytical provides insight into using vacuum coating in sample preparation and EDS analysis. Read our latest article to find out why!
JH Analytical celebrates the art of Metallography and the coexistence of science and art.
This case study explains measuring membrane deflection for biological sensors in a non-destructive way using an optical profiler vs. SEM.
Sputter coating grounds your specimen by covering it with a thin, conductive material layer—typically metal—to improve imaging significantly.
213 Hammond Avenue Fremont, CA 94539
T 408-436-6336
F 408-436-6343
info@jhtechnologies.com
