Check out all of the equipment at your service in our analytical lab. We are happy to demonstrate our capabilities any time.
Imaging & Analysis
Metallography Sample Preparation
EM Sample Preparation
Digital Microscope, Leica DVM6
A digital solution for large and small parts featuring stitching and 3D imaging.
Field Emission Scanning Electron Microscope (SEM), Apreo S FE SEM
Scanning electron microscope for versatile, high performance materials imaging and analysis.
Electron Backscatter Diffraction (EBSD)
The latest generation of EBSD detectors
for high-speed and high-sensitivity data acquisition.
Energy Dispersive Spectroscopy (EDS), available for both SEMs
Taking the EDS technique from the static
to the dynamic with real-time chemical imaging.
Upright Materials Microscope, Leica DM2700M
High magnification imaging and analysis
Leica Application Suite X (LAS X) for Materials Analysis
A software suite for straightforward imaging and documentation for industrial applications.
Buehler Omnimet Metallurgical Imaging Software
Image analysis software with a flexible database.
High Speed Precision Cutting Saw, Buehler Isomet Pro
Sectioning saw for a large range of materials.
Automated Grinder Polisher, Buehler Automet 250
Workhorse automated grinder and polisher.
Semi-Automatic Grinder Polisher, Buehler EcoMet 30 Auto
New generation semi-automatic grinder-polisher.
Vibratory Polisher, Buehler Vibromet 2
Thin Sectioning System, Buehler Petrothin
Precision thin-section tool for geological samples.
Ion Beam Milling System, Leica TIC 3X
Highly flexible dual beam system for faster processing.
Target Preparation Device, Leica EM TXP
Quickly prepare samples prior to ion milling reducing production time.
High Vacuum Sputter Coater with Carbon and Metal Sputtering, Leica ACE 600
Coating system capable of sputtering 2 different materials.
Microhardness Tester for Vickers and Knoop, Buehler VH1202, DiaMet Software
Versatile hardness tester.
Precision Cutting Saw- Buehler IsoMet 1000
A precision sectioning saw designed for cutting various types of materials with minimal deformation.
Compression Mounting, Buehler SimpliMet 4000
Eliminate bottlenecks at the mounting stage, rapidly transforming your cut samples into specimens ready for grinding and polishing.
Sensofar S neox
Active illumination Focus Variation vertically scans either optics or the sample to obtain a continuous set of images of the surface.
Mitutoyo Vision Measurement
Suitable for measuring semiconductors, electronics, medical devices, automobile parts, resin moldings, and tools.
SPT-20 ion Sputter Coater
A compact ion coating system ideal to support table-top SEM's. The system can sputter noble metals such as gold (Au), palladium (Pd), platinum (Pt), and silver (Ag) for non-conductive or poorly conductive specimens.
Coxem Cross Section Polisher CP-8000+
An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.
A high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range.
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