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Check here for the latest application notes from JH Analytical and our manufacturing partners.
Why Ion Flat Milling? Getting the Most Out of Your Sample
Author Tim Schoen, Lab Director, JH Technologies Controlled Surface Preparation for Microstructural Analysis Sharper Patterns. Faster Maps. Deeper Insight. A polished sample can look smooth under an optical microscope and
What Is Interferometry?
Author Tim Schoen, Lab Director, JH Technologies Understanding How Interference Patterns Reveal Surface Information Interferometry is a measurement technique used to study waves by observing the interference patterns created when
Why Is Crystallographic Orientation Mapping Important?
Author Tim Schoen, Lab Director, JH Technologies Understanding Materials Through Crystallographic Orientation Mapping with EBSD A material’s properties are not determined only by what it is made of. They are
Preparing Copper for EBSD: Why a Mirror Finish Isn’t Enough
Author William Bond , Lab Manager, JH Technologies What looks perfect under the optical microscope can still produce poor EBSD data. Electron Backscatter Diffraction (EBSD) has become one of the
Chemical Decapsulation
Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence. Â Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor
Elemental Analysis: SEM+EDS
Author Tim Schoen, Lab Director, JH Technologies Understand What Your Material Is Made Of When a contaminant, corrosion site, or unknown particle appears, EDS analysis from JH Technologies helps identify
