Author Tim Schoen, Lab Director, JH Technologies Understanding Materials Through Crystallographic Orientation Mapping with EBSD A material’s properties are not determined only by what it is made of. They are
Author Tim Schoen, Lab Director, JH Technologies Understanding How Interference Patterns Reveal Surface Information Interferometry is a measurement technique used to study waves by observing the interference patterns created when
Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence. Â Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor
Author Tim Schoen, Lab Director, JH Technologies Understand What Your Material Is Made Of When a contaminant, corrosion site, or unknown particle appears, EDS analysis from JH Technologies helps identify
Author Tim Schoen, Lab Director, JH Technologies A proven, cost-effective technique for identifying failure mechanisms in BGA, CSP, and other advanced electronic assemblies. Why Dye & Pull Analysis Matters As
SERIES Part 1: The Journey of an Electronic Device Through the Analytical Lab In the first article of this series, you will experience the steps of a typical workflow used
Producing Memory Device Cross-Sectioning Samples Our newest JH Analytical Team member David is supporting and learning all of the functions in the lab. What better way to learn than to
We are often asked what final polishing compound provides the best results for sample preparation. This application note describes what we use and why… The short answer: it’s complicated. The
