
Mapping Capabilities – Apreo SEM
We have incorporated mapping capability for our Apreo SEM Combining and overlaying EDS Element maps on an electron image to make one informative colored image is fast becoming a common
We have incorporated mapping capability for our Apreo SEM Combining and overlaying EDS Element maps on an electron image to make one informative colored image is fast becoming a common
One of the questions we often get from our customers is how they can improve the performance and shorten the cycle times when using an ion mill. Enter the Leica
This is a follow-up to our Tip from the August newsletter. In that edition, we discussed how to mount a thin, flexible, delicate, and/or soft sample for increased mechanical stability
Last month we discussed methods of preparing samples for EBSD analysis. As a recap, EBSD requires a highly polished, flat surface for best results. The two most common ways to
Although EBSD (Electron Backscatter Diffraction) as a technique to study the crystalline structure of materials has been around for a while now, its popularity has grown of late due to
213 Hammond Avenue Fremont, CA 94539
T 408-436-6336
F 408-436-6343
info@jhtechnologies.com