Targeted Polishing

The targeted cross-section polishing process involves the use of application-specific tooling to remove material from a sample in sub-micron step sizes selectively.

By controlling the polishing process or using a step-driven grinding tool, we can intercept extremely small features, inclusions, or defects, even if they are not externally visible.

Related Targeted Polishing Tools


Related Targeted Polishing Articles

Contact Us

Recent Posts

Chemical Decapsulation

Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence.   Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor

Read More »
EDS-chart-with-elements

Elemental Analysis: SEM+EDS

Author Tim Schoen, Lab Director, JH Technologies Understand What Your Material Is Made Of When a contaminant, corrosion site, or unknown particle appears, EDS analysis from JH Technologies helps identify

Read More »

CONTACT US