Why Ion Flat Milling? Getting the Most Out of Your Sample

Author Tim Schoen, Lab Director, JH Technologies Controlled Surface Preparation for Microstructural Analysis Sharper Patterns. Faster Maps. Deeper Insight. A polished sample can look smooth under an optical microscope and […]

Chemical Decapsulation

Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence.   Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor […]

Elemental Analysis: SEM+EDS

EDS-chart-with-elements

Author Tim Schoen, Lab Director, JH Technologies Understand What Your Material Is Made Of When a contaminant, corrosion site, or unknown particle appears, EDS analysis from JH Technologies helps identify […]

How To: Prepare Titanium for Optimal EBSD Analysis

Author Yifan Jiang, Phd. JH Technologies, Applications Scientist Technical Overview: Sample Preparation of Ti-6Al-4V Alloy for EBSD Analysis Titanium Alloy Introduction Titanium and its alloys are widely used in energy, […]

430 Year Old Coin Under The Microscope

 Author Micah Harrel, CTO, JH Technologies Imaging a 16th-Century Spanish One Real with Modern Tools For my high school graduation—many moons ago—I received an unusual gift: four Spanish silver coins […]

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