Click the link below to download the Sensofar LEA matching paper.
A discussion of performing the matching algorithm in three studies conducted using different Ruger weapons.
Using the 3D measurements allows for the examination of both peaks and valleys in LEAs. See how to get the best results in this paper of three scoring measures.
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Materials Characterization / Technical Article Electron Backscatter Diffraction (EBSD) Microstructural characterization for failure analysis, process validation, and materials reliability assessment. Author: Tim SchoenRole: Lab Director, JH Technologies Technical contents Summary
Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence. Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor
Author William Bond , Lab Manager, JH Technologies What looks perfect under the optical microscope can still produce poor EBSD data. Electron Backscatter Diffraction (EBSD) has become one of the
Author Tim Schoen, Lab Director, JH Technologies Understand What Your Material Is Made Of When a contaminant, corrosion site, or unknown particle appears, EDS analysis from JH Technologies helps identify
