Semiconductor

Author Tim Schoen, Lab Director, JH Technologies Controlled Surface Preparation for Microstructural Analysis Sharper Patterns. Faster Maps. Deeper Insight. A polished sample can look smooth under an optical microscope and

Author Tim Schoen, Lab Director, JH Technologies Understanding Materials Through Crystallographic Orientation Mapping with EBSD A material’s properties are not determined only by what it is made of. They are

Author Tim Schoen, Lab Director, JH Technologies Understanding How Interference Patterns Reveal Surface Information Interferometry is a measurement technique used to study waves by observing the interference patterns created when

Author Tim Schoen, Lab Director, JH Technologies Access the Die. Preserve the Evidence.   Chemical decapsulation is a controlled sample preparation technique used to remove the plastic encapsulant from semiconductor